• TTM and MetaEdit+, Modelica Integrated using Semantic Web Technologies
• Capers Jones Reports that T-VEC Method Finds More Software Defect
• The First Aircraft Institute of AVIC Chooses T-VEC for Model-Based Testing
• MetaEdit+ DSM and T-VEC integration
• T-VEC Project at Lockheed Martin Published in STSC CrossTalk
• Dr. Blackburn Presents Model-Based Tool Comparison at S5 Symposium
• Support for Arrays in TTM
• LDRA Integration Support
• T-VEC Wiki
• Vision Microsystems distributes T-VEC in China
• Fujisetstubi distributes T-VEC in Japan
• T-VEC Completes Model for Government Smart Card Interoperability Specification

• Archives

T-VEC Presents at QAAM/QAI - The Big Problem That Process Improvement Hasn't So

Organizations spend 50 to 75 percent of their effort on one a key problem that has not been addressed by the last 20 years of process improvement efforts. This key costly problem is becoming more evident as the complexity of systems continues to increase. A few companies have adopted a new technology that significantly reduces cycle-time and cost. Some commercially available technologies dance around the problem. This talk discusses the problem, compares some related technologies, describes the key reason why this technology solves many problem, and describes some organizational best practices in applying this technology.