• TTM and MetaEdit+, Modelica Integrated using Semantic Web Technologies
• Capers Jones Reports that T-VEC Method Finds More Software Defect
• The First Aircraft Institute of AVIC Chooses T-VEC for Model-Based Testing
• MetaEdit+ DSM and T-VEC integration
• T-VEC Project at Lockheed Martin Published in STSC CrossTalk
• Dr. Blackburn Presents Model-Based Tool Comparison at S5 Symposium
• Support for Arrays in TTM
• LDRA Integration Support
• T-VEC Wiki
• Vision Microsystems distributes T-VEC in China
• Fujisetstubi distributes T-VEC in Japan
• T-VEC Completes Model for Government Smart Card Interoperability Specification

• Archives

T-VEC Completes Model for Government Smart Card Interoperability Specification

T-VEC has produced a model for the Government Smart Card Interoperability Specification v2.1 (NISTIR 6887) Basic Services Interface (BSI). The model specifies behavior, conditions, and actions for 23 Java methods of BSI Java Binding Conformance Test. T-VEC tools are used to automatically generate test vectors and test drivers for the modeled specification that can be used to ensure conformance of a smart card implementation with the specification standard.