• TTM and MetaEdit+, Modelica Integrated using Semantic Web Technologies
• Capers Jones Reports that T-VEC Method Finds More Software Defect
• The First Aircraft Institute of AVIC Chooses T-VEC for Model-Based Testing
• MetaEdit+ DSM and T-VEC integration
• T-VEC Project at Lockheed Martin Published in STSC CrossTalk
• Dr. Blackburn Presents Model-Based Tool Comparison at S5 Symposium
• Support for Arrays in TTM
• LDRA Integration Support
• T-VEC Wiki
• Vision Microsystems distributes T-VEC in China
• Fujisetstubi distributes T-VEC in Japan
• T-VEC Completes Model for Government Smart Card Interoperability Specification

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T-VEC to Present Dynamic System Testing At ISSRE 2003

This presentation discusses recent advancements of the test generation system to produce test sequences for testing dynamic systems from design modeling systems such as Mathworks' Simulink and National Instruments' MATRIXx. Test sequences support test generation for systems that are modeled using constructs that support feedback, such as integrators or time delays, which are common in control system models. Test sequences can address the logic paths, and computation testing in the software as well as dynamic aspects of systems response.